Cascade Microtech sets new standard for 300mm wafer probing
(Technology News, 28 Mar 2008 )
Cascade Microtech has introduced the next step in 300mm wafer probe stations designed to meet the worldwide need for advanced on-wafer measurements for semiconductor devices. Based on Cascade Microtech's industry-leading wafer probing products, the Elite 300 sets a new standard for extremely accurate and reliable 300mm wafer probing for devices with process nodes at 45nm and below. The Elite 300 solves the critical measurement challenges at each advancing technology node by incorporating state-of-the-art electrical and mechanical technology, advanced materials and leading-edge measurement techniques.
The Elite 300 offers end-to-end productivity improvements through its advanced ergonomic design, market-leading measurement capability and flexibility to be the wafer probing platform of choice now and in the future. Elite 300 applications include RF/DC device characterization and modeling, wafer-level reliability, IC failure analysis and design debug. By acquiring the advanced Elite 300 wafer probe station today, semiconductor manufacturers won’t have to retool at each process node or lose business to competing foundries with more accurate test capabilities. The potential savings could amount to hundreds of thousands of dollars over the next three to five years and the next two to three process nodes, based on typical capital purchasing cycles in the semiconductor industry.
