Cascade Microtech announces strategic initiative to maximize lab and fab investments via fully integrated measurement systems
(Business News, 04 Jun 2008 )
In response to the ever-increasing cost associated with developing new process nodes, Cascade Microtech announced a new initiative to develop integrated measurement systems for on-wafer semiconductor device characterization and process development. This innovative approach results in increased performance and accuracy as well as better, faster service and support and renders obsolete the traditional practice of bolting together system elements from multiple vendors.
Because each system is designed from the ground up to optimize measurement capability, Cascade Microtech's integrated measurement systems offer the industry's only certified measurement accuracy. The first such system, also being announced today, is the EDGE Flicker Noise Measurement System (see press release dated May 19, 2008: Cascade Microtech Offers Industry's First Fully Integrated Flicker Noise Measurement System).
Cascade Microtech's first integrated measurement system, the EDGE Flicker Noise Measurement System, tackles the very difficult challenge of accurately identifying flicker noise, an illusive measurement to obtain. In addition, Cascade Microtech has identified a number of other critical measurement challenges it believes are best solved via integrated measurement systems, which it will roll out in the coming months.
