EDN India - Test & Measurement

Tektronix Delivers Oscilloscopes at Entry-Level Price for Mixed Signal Designs

Tue, 2 Dec 2008 00:00:00 +0800

Tektronix announced the new MSO2000 Mixed Signal and DPO2000 Digital Phosphor oscilloscopes. The new series provide powerful tools to simplify the debug of mixed signal designs including Wave Inspectorsearch ....

EDN Asia Webcast Updates

Tue, 2 Dec 2008 00:00:00 +0800

Want to know more about �Smart� TDDB Algorithms implemented using the Keithley 2600 Series SourceMeter? Click the link above to view the online seminar now!

NI LabVIEW 8.6 Accelerates Wireless Device Test with Multicore and FPGA Technologies

Tue, 2 Dec 2008 00:00:00 +0800

National Instruments India launched LabVIEW 8.6, the latest version of the graphical system design platform for test, control and embedded system development, in India at the India LabVIEW Conference ....

Stable and Economical Digital Differential Pressure Sensor

Mon, 24 Nov 2008 00:00:00 +0800

It is a well-known fact that using a differential pressure sensor can facilitate improved control and monitoring in many application scenarios. However, this requires a sensor that operates with high ....

Noisecom Signal Generator for CATV Installation Testing

Tue, 18 Nov 2008 00:00:00 +0800

Noisecom introduces the Merlin product line, handheld signal generators for CATV installation testing. Troubleshooting existing cable installations with digital signal problems can be difficult. Older ....

Kionix Presents "World's Lowest" Power Consumption Accelerometer with Embedded Algorithms

Tue, 18 Nov 2008 00:00:00 +0800

Kionix announced the expansion of its digital-output, tri-axis accelerometer product line with the KXTE9 product series. With embedded algorithms for orientation and activity monitoring, the KXTE9 simplifies ....

Qualcomm Opens Asia Pacific Test Center of Excellence in Singapore

Mon, 17 Nov 2008 00:00:00 +0800

Qualcomm Incorporated has opened its Asia Pacific Test Center of Excellence in Singapore. The Center is Qualcomm's first test development center outside of the United States, and it will enable Singapore ....

FEI's New TrueCrystal Package Provides Rapid, Accurate Strain Profiling for Semiconductor Manufacturing

Mon, 17 Nov 2008 00:00:00 +0800

FEI Company, a provider of atomic-scale imaging and analysis systems, recently released its new TrueCrystal Strain Analysis package that can be installed on a Titan or Tecnai scanning/transmission electron ....

Wasion Announces Broad Cooperation Agreement with Teridian Semiconductor

Fri, 14 Nov 2008 00:00:00 +0800

Wasion Meters Group Limited and Teridian Semiconductor Corporation have announced a strategic agreement to introduce advanced 3-Phase and 1-Phase metering products for domestic and export applications ....

LitePoint's IQmax/IQfact Successfully Test Fujitsu's Mobile WiMAX Reference Designs

Fri, 14 Nov 2008 00:00:00 +0800

LitePoint Corporation has announced the successful testing of Fujitsu Microelectronics' Mobile WiMAX reference designs based on its WiMAX baseband and RF silicon solutions. The combination of LitePoint's ....

Geotest Joins Semiconductor Test Consortium

Thu, 13 Nov 2008 00:00:00 +0800

Geotest has joined the Semiconductor Test Consortium (STC), the semiconductor industry's leading proponent for the development and adoption of value-added open test standards. As a member, Geotest will ....