| |
|
|
| |
|
| By Senior Technical Editor Dan Strassberg |
|
| By Rajit Chandra |
| Verifying the quality and reliability of integrated circuits designed with nanometer technology is a complex task that cannot be overlooked in a design flow |
|
| Jim Fenton, Tektronix Inc |
| Digital systems now often include multiple processors and multiple buses. Obtaining precisely time-correlated data from these disparate elements is the key to successful debugging |
|
| |
|
| Bill Schweber in the USA |
|
| Bill Schweber |
|
| Bill Schweber |
|
| Shree Jaisimha |
|
| Shree Jaisimha |
|
| Shree Jaisimha |
|
| John Ribeiro in India |
|
| Asha Yoon in South Korea |
|
| Chris Hall in Taiwan |
|
| Bill Schweber |
|
| |
|
| By N.S. Manjunath, Editor |
|
| |
|
| David Chen, Linear Technology Corp, Milpitas, CA, USA |
|
| Stefan Strozecki, Institute of Telecommunications, Bydgoszcz, Poland |
|
| Lutz von Wangenheim, University of Applied Sciences, Bremen, Germany |
|
