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| By Paul Rako, Technical Editor, EDN |
| Measuring low currents can be tricky. Clever analog-design techniques and the right parts and equipment can help. |
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| By Kymberly Schmidt, Maxim Integrated Products |
| A key challenge to designers of audio subsystems that must conform to Windows Vista requirements may be choosing coupling capacitors. These devices’ capacitance varies with the voltage across them and introduces audio distortion. |
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| By Wilfredo Rivas-Torres, Applications Engineer, Agilent Technologies |
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| by Kirtimaya Varma |
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| by Robin Lange, Managing Editor, EDN Asia |
| Eric Starkloff, Director of Product Marketing for Test at National Instruments, recently spoke with EDN Asia on the company’s continuing development of virtual instrumentation to meet the increasing demands for highly intelligent and reliable products. Excerpts: |
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| Grant Smith, National Semiconductor, Phoenix, AZ; Edited by Brad Thompson and Fran Granville, EDN |
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| Susanne Nell, Breitenfurt, Austria; Edited by Brad Thompson and Fran Granville, EDN |
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| Steve Hageman, Windsor, CA; Edited by Brad Thompson and Fran Granville, EDN |
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| By Matthew Miller, Editor in Chief, EDN |
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| By Matthew Miller, EDN |
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