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| by Michael Santarini, Senior Editor, EDN |
| The FPGA industry faces the endless and unavailing task of addressing demand for low-power operation, even as vendors face the lure of performance, density, and price-per-gate advantages of the 65nm process node. |
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| by David Marsh, Contributing Technical Editor, EDN |
| Capacitive proximity sensors embody an old concept that today’s IC technologies promise to deliver. Vendors vie to win over new markets in the automotive, consumer, and industrial markets using methods that combine traditional analog with the best of contemporary digital techniques. |
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| by Robert Cravotta, Technical Editor, EDN |
| New features must be smarter to add value without distracting the driver and increasing the risk of accidents. |
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| by John Bottrill, Senior Application Engineer, Texas Instruments |
| Functions that require different features are not always compatible on a single capacitor. |
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| by Kirtimaya Varma, Editor-in-Chief |
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| by Denice Cabel, Editor, EDNAsia Online |
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| Noureddine Benabadji, University of Sciences and Technology, Oran, Algeria |
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| Jim McLucas, Longmont, CO |
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| Kirtimaya Varma |
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| Margery Conner Technical Editor, EDN |
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| Maury Wright, Editor-in-Chief, EDN |
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| Maury Wright, Editor in Chief, EDN |
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| by Brian Dipert, Senior Technical Editor, EDN |
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