Design Feature

External components improve SAR-ADC accuracy

(EDN Asia, 1 Sep 2007)
It is tempting to use an op amp to directly drive the input of a SAR (successive-approximation-register) ADC. Unfortunately, this configuration can limit circuit performance. An external RC (resistor-capacitor) ....
 

Squeezing a low-cost multiprocessor platform out of 130nm

(EDN Asia, 1 Sep 2007)
Sometimes designing an SOC (system on chip) on the latest and greatest process technology is not what it takes to make an impact on the cost-conscious consumer-electronics market. Thats a lesson LSI ....
 

Extreme low-power design

(EDN Asia, 1 Aug 2007)
A typical modern pacemaker may consume on average only a few microamperes of current to achieve long battery life. To meet these low power requirements, engineers use many techniques that may be applicable ....
 

PCI Express prompts quiet evolution

(EDN Asia, 1 Aug 2007)
Largely unknown to users, the PC industry, with embedded computing following close behind, is in the middle of a quiet shift in technology. The overtaxed PCI (Peripheral Component Interconnect) bus for ....
 

Choose capacitor types to optimize PC sound quality

(EDN Asia, 1 Jul 2007)
Microsofts next-generation client operating systemnow officially known as Windows Vistais enhancing desktop- and notebook-PC audio quality and fidelity. Hardware manufacturers must meet strict audio-performance ....
 

Handling weak energy sources

(EDN Asia, 1 Jun 2007)
Convenient use of portable equipment implies having short maintenance periods. This means the time period when the portable device needs to be connected to service stations for doing any kind of configuration ....
 

Imaging beyond pixels: Enhancing the elementary picture

(EDN Asia, 1 Jun 2007)
A 2004 EDN cover story made the then-somewhat-controversial claim that image sensors pixel-count growth rate would soon slow and that sensor implementers would subsequently need to distinguish their ....
 

Maximizing EOS and ESD immunity in high-performance serial buses

(EDN Asia, 1 May 2007)
EOS (electrical overstress) and ESD (electrostatic discharge) are the main causes of failures in semiconductors. Although EOS often takes the blame, ESD may sometimes accompany EOS. Did the assembly machinery ....
 

Taking control of machine vision

(EDN Asia, 1 May 2007)
In humans, sight is one of the most important senses. Vision allows us to identify objects, examine them without touching them, determine spatial dimensions and relationships, and navigate safely through ....
 

A logical approach to NVM integration in SoC design

(EDN Asia, 1 Apr 2007)
SoC designers have several options for integrating NVM (nonvolatile memory) into their designs, so it's wise to weigh the availability and numerous trade-offs before jumping headfirst into integrating ....
 
 
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