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October 8, 2008

DESIGN CENTER

TEST & MEASUREMENT

TOP STORY

SoftJin’s NxDAT Mask Defect Analysis Software Combines Mask Inspection and Design Automation Worlds 7/10/2008

SoftJin has announced NxDAT, software for efficient Analysis of Defects identified by Mask Inspection Systems. The software includes features for easy and fast defect navigation, visual display, defect selection and filtering, defect classification, clustering, sophisticated CD analysis, analysis over multiple Inspections, Repeatability and Trend Analysis. These features along with automatic generation of reports, charts, graphs, image mosaics and paretos significantly improve the productivity of the mask inspection operators. The software supports ...

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KNOWLEDGE CENTER

Panasonic Key Devices Guide 2008 :

Fairchild Semiconductor :

Texas Instruments: DaVinci™ Technology

Texas Instruments: Safe Bet Series

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News Hightlights

Texmac introduces new double-sided Takaya APT-9600 Flying-Probe Tester and Double-Sided Retrofit for APT-9411 at APEX 3/4/2008

TekExpress compliance test automation framework delivers architecture to support serial data test automation needs 2/4/2008

Aeroflex releases new RF spectrum analyzer option and P25 capabilities for the 3500 hand-held radio test set 31/3/2008

JDSU intros new features to complete DSL field test instrument 27/3/2008

Aeroflex delivers complete support for W-CDMA A-GPS conformance testing 24/3/2008

Agilent Technologies introduces oscilloscopes with big display, and fast waveform update rate 20/3/2008

Tektronix introduces “one box” serial data receiver test solution 19/3/2008

“World’s fastest” probe 18/3/2008

Accurate fault detection in optical submarine cables 17/3/2008

FlexRay physical layer test tool for automotive 17/3/2008

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Press Release

Inauguration of SoCIP 2008 Seminar & Exhibition Showcasing Advanced SoC design Solutions 22/9/2008

GAO Offers a New UHF RFID Interrogator CF Card 19/9/2008

Radware Introduces a New Virtualization Solution as Part of its Business-Smart Data Center Strategy 18/9/2008

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CURRENT ISSUE

October 2008

COVER STORY:

Sensor-rich designs

As the cost of microprocessors and sensors continues to drop, autonomous and semiautonomous systems can incorporate more intelligence and make more optimal decisions based on a better understanding of their internal condition and the immediate environment surrounding them. Adding sensors and the int ...

HIGHLIGHTS:

Measurement-based simulation simplifies analysis of lossy backplanes and cables

Spread-spectrum-clock generators reduce EMI and signal-integrity problems

SPECIAL REPORT

Efficient and reliable digital power conversion: A new paradigm 1/10/2008

Smart power management solution greatly reduces energy consumption 1/9/2008

Advanced network planning and optimization tools are vital for WiMAX success 1/8/2008

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DESIGN FEATURES

Spread-spectrum-clock generators reduce EMI and signal-integrity problems 1/10/2008

Measurement-based simulation simplifies analysis of lossy backplanes and cables 1/10/2008

Selecting video op amps 1/9/2008

PULSE

Auto equalizer for twisted-pair cables in security video systems 1/10/2008

Tiny load switch with high current for max mobile features 1/10/2008

EPON reference designs enable next-gen FTTH solutions 1/10/2008

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Highest Rated

On2 Technologies Announces New High Definition Hardware Encoder IP

3/10/2008

Global Semiconductor Industry Outlook Remains Positive

12/9/2008

Qimonda Starts Volume Production of Rambus XDR DRAM for PLAYSTATION3 Computer Entertainment System

10/9/2008

Most Viewed

Suprema Live-scanner Receives FBI Certification 26/9/2008

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RS-232-to-TTL converter tests UARTs with a PC 1/9/2008

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Power Technology E-newsletter

Dual-input, Single-output Power Supply Selector Switch Reduces System Size while Improving Integrity EDNA, February 08

Analog Devices completes sale of CPU voltage and PC thermal monitoring business to ON SemiconductorEDNA, January 08

Fairchild’s Green FPS Power Switches Increase Efficiency, Reduce EMI in Power Supply Designs EDNA, December 07

Test and Measurement E-newsletter

Agilent Technologies and Anite Announce Strategic Partnership to Deliver 3GPP LTE Test Solutions for Wireless R&D EDNA, November 07

WiMAX Technology Leaders Aeroflex and Sequans Partner to Speed Product Development and Deployment of WiMAX Test EDNA, October 07

Tektronix’ IMS Solution Proves Successful in Industry Forum Tests EDNA, September 07

KNOWLEDGE CENTER

Panasonic Key Devices Guide 2008:

Fairchild Semiconductor :

Texas Instruments: DaVinci™ Technology

Texas Instruments: Safe Bet Series

INDUSTRY LINKS

Photonics Association (Singapore)
Singapore Industrial Automation Association (SIAA)